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Sakai, Takuro; Iikura, Hiroshi; Yamada, Naoto*; Sato, Takahiro*; Ishii, Yasuyuki*; Uchida, Masaya*
QST-M-8; QST Takasaki Annual Report 2016, P. 140, 2018/03
Seki, Yoshichika; Shinohara, Takenao; Parker, J. D.*; Yashiro, Wataru*; Momose, Atsushi*; Kato, Kosuke*; Kato, Hidemi*; Sadeghilaridjani, M.*; Otake, Yoshie*; Kiyanagi, Yoshiaki*
Journal of the Physical Society of Japan, 86(4), p.044001_1 - 044001_5, 2017/03
Times Cited Count:13 Percentile:66.28(Physics, Multidisciplinary)For the effective phase imaging at pulsed neutron sources, we have designed and developed the multi-colored Talbot-Lau interferometer which works at several wavelengths. At the Energy Resolved Neutron Imaging System RADEN in J-PARC, we demonstrated its operation by observing the visibilities of moire fringes derived from different wavelengths (0.25, 0.50, and 0.75 nm). We also investigated the variation of moire fringes dependent on the wavelength resolution from 18% to 50% and showed the advantage of pulsed beams. At the central wavelength of 0.5 nm, we have succeeded in interferometric imaging for the samples of metal rods made of aluminum, lead, and copper. An absorption grating as an analyzer was fabricated by imprinting of metallic glass for the first time, and showed a clear moire fringe with the high visibility of 68% and a well-controlled shape in comparison with previous ones fabricated by oblique evaporation of gadolinium.
Terauchi, Masami*; Imazono, Takashi; Koike, Masato
Hyomen Kagaku, 36(4), p.184 - 188, 2015/04
Electron beam induced soft-X-ray emission spectroscopy (SXES) that uses a grating spectrometer has been introduced to a conventional scanning electron microscope (SEM) for characterizing desired specimen areas of bulk materials. The spectrometer has a grazing-incidence flat-field optics by using aberration corrected (varied-line-spacing) gratings, which has already been applied to transmission electron microscopes. The best resolution was confirmed as 0.13 eV at Mg L-emission (50 eV), which is comparable with that of recent dedicated electron energy-loss spectroscopy instruments. Apparent band structure effects have been observed in Mg-L, Si-L, B-K, and Ti-L emission spectra obtained from bulk materials using SEM-SXES instrument.
Koike, Masato; Imazono, Takashi; Ishino, Masahiko
Advances in X-Ray Chemical Analysis, Japan, 46, p.159 - 166, 2015/03
The demand for the physical-properties research using powerful light sources, such as synchrotron radiation and soft-X-rays laser light, is increasing. When promoting such research, it is required to develop efficient soft-X-ray spectrometers suitable for absorption, emission, and fluorescence which are appeared in an energy rage of 1-8 keV. We describe the development of laminar type diffraction gratings which enhance diffraction efficiency remarkably by use of soft-X-ray multilayers instead of single metal layers.
Koike, Masato; Sano, Kazuo*
Dai-5-Han Jikken Kagaku Koza 10; Busshitsu No Kozo 2, Bunko (Ge), 10, p.106 - 153, 2005/08
The chapter provides the basic knowledge of "vacuum ultraviolet spectrometers" and "ray racing" for young scientists without reading the numerous references and is intend to be the handbook for the specialist in various related sciences when they initiate spectroscopic experiments in the vacuum ultraviolet region. The content includes the basis of diffraction gratings, Optical properties of diffraction gratings, aberration theories, diffraction efficiency theories, basis of spectrometers, vacuum ultraviolet plane grating spectrometers, vacuum ultraviolet concave grating spectrometers, soft X-ray plane grating spectrometers, soft X-ray concave grating spectrometers, basis of ray tracing, applications of ray tracing, analytic design method, hybrid design method, etc.
Koike, Masato; Namioka, Takeshi*
AIP Conference Proceedings 705, p.865 - 868, 2004/00
The high brightness soft X-ray sources have been playing an important role in frontier sciences and high technologies. Then it is often required to perform high-resolution spectroscopic measurements in the energy region of 1-10 keV by using a single instrument. Unfortunately, both the grating and the crystal spectrometer cannot meet the requirement satisfactorily, because of various problems they have in the efficiency, spectral resolution, and wavelength scanning range. To overcome these problems we have developed a conical diffraction type grating spectrometer for use in the 1-4 keV region. The spectrometer employs a toroidal mirror and a plane holographic grating to separate the imaging and dispersing functions. This spectrometer works both as monochromator and as spectrograph. In this paper, we describe details of the design and give the expected performance of the spectrometer for cases of practical interest in the use of soft X-ray synchrotron radiation and laboratory sources.
Terauchi, Masami*; Koike, Masato
Microscopy and Microanalysis, 9(S02), p.894 - 895, 2003/08
We have been developing a high energy-resolution soft-X-ray spectrometer for a transmission electron microscope to obtain the information of the density of states (DOS) of the valence band (occupied states) from identified small specimen areas. We have designed and produced a new grating. The new varied-line-spacing laminar-type holographic grating was designed to have a focal distance of about 50 cm. An energy resolution of about 0.7 eV is expected for X-ray energy of about 1000 eV.
Isayama, Akihiko; Iwama, Naofumi*; Hosoda, Yosuke*; Satake, Shinsuke*; Isei, Nobuaki; Ishida, Shinichi; Sato, Masayasu
Japanese Journal of Applied Physics, Part 2, 42(3), p.L329 - L331, 2003/03
Times Cited Count:2 Percentile:10.73(Physics, Applied)no abstracts in English
Koike, Masato; Sano, Kazuo*; Gullikson, E. M.*; Harada, Yoshihisa*; Kumata, Hideki*
Review of Scientific Instruments, 74(2), p.1156 - 1158, 2003/02
Times Cited Count:24 Percentile:72.13(Instruments & Instrumentation)Laminar-type holographic grating having a groove density of 2400 lines/mm was designed and fabricated for use with a soft X-ray flat field spectrograph covering the 0.7-6 nm region. The varied-line-spaced grating pattern was generated by use of an aspheric wave-front recording system and the laminar-type grooves were formed by a reactive ion-etching method. The performance of the grating was evaluated by using a molybdenum K X-ray generator and a spectrograph with a CCD imaging detector. Also the absolute diffraction efficiencies of 0th, 1st, 2nd, and 3rd spectral orders were measured by use of the reflectometers installed at synchrotron radiation beamlines. The experimental results showed that the holographic grating indicated comparable spectral resolution and maximum first-order diffraction efficiency (2%) at 2 nm with a replica grating made from a mechanically ruled varied-line-spacing grating, and it also showed higher efficiency in 1.0nm region and lower level higher order light over the whole wavelength range than the replica grating.
Koike, Masato
Saishin Kogaku Gijutsu Handobukku, p.284 - 287, 2002/09
no abstracts in English
Koike, Masato; Sano, Kazuo*; Harada, Yoshihisa*; Yoda, Osamu; Ishino, Masahiko; Tamura, Keisuke*; Yamashita, Kojun*; Moriya, Naoji*; Sasai, Hiroyuki*; Jinno, Masafumi*; et al.
X-Ray Mirrors, Crystals, and Multilayers II (Proceedings of SPIE Vol.4782), p.300 - 307, 2002/07
For the purpose of realizing an evaluation beamline for characterizing soft X-ray optical elements in a wide wavelength range of 0.7-25 nm, we have designed and constructed a new type of monochromator that combined two types of Monk-Gillieson monochromators. One is a conventional type equipped with three varied-line-spacing plane gratings, allowing a choice of two included angles. The other is a new type that employs a scanning mechanism based on Surface Normal Rotation (SNR). The SNR scheme provides high throughput at short wavelengths and simple scanning mechanism by means of a grating rotation about its normal. The monochromator is operated in the SNR and conventional modes over the ranges of 0.7-2.0 nm and 2.0-25 nm, respectively. In this paper we describe the optical and mechanical designs of the monochromator, wavelength calibrations in the SNR mode, and preliminary experimental data, such as the transmittance of an Al filter at 0.8 nm and the total yield photoelectron measurement on a MgO powder in a wavelength rage of 0.7-2 nm.
Koike, Masato; Sano, Kazuo*; Yoda, Osamu; Harada, Yoshihisa*; Ishino, Masahiko; Moriya, Naoji*; Sasai, Hiroyuki*; Takenaka, Hisataka*; Gullikson, E. M.*; Mrowka, S.*; et al.
Review of Scientific Instruments, 73(3), p.1541 - 1544, 2002/03
Times Cited Count:20 Percentile:68.31(Instruments & Instrumentation)no abstracts in English
Koike, Masato; Namioka, Takeshi*
Applied Optics, 41(1), p.245 - 257, 2002/01
Times Cited Count:14 Percentile:54.48(Optics)A plane grating monochromator having a simple wavelength scanning method requiring only a rotation of a grating about its normal was analyzed on the basis of the light path function. This scanning method has been known as surface normal rotation (SNR). A varied line spacing (VLS) plane grating was assumed to be illuminated by a convergent beam generated by a spherical mirror. We gave the analytical expressions for the grating equation, focal conditions, direction of dispersion, slant angle and length of astigmatic image, and a method to optimize the groove parameters of the VLS grating. The results of this analysis and the expected resolving power were evaluated by means of ray tracing for two model systems.
Yoshigoe, Akitaka; Agui, Akane; Nakatani, Takeshi*; Matsushita, Tomohiro*; Saito, Yuji; Yokoya, Akinari
Journal of Synchrotron Radiation, 8(Part2), p.502 - 504, 2001/03
no abstracts in English
Isayama, Akihiko; Isei, Nobuaki; Ishida, Shinichi; Sato, Masayasu; Kamada, Yutaka; Ide, Shunsuke; Ikeda, Yoshitaka; Takahashi, Koji; Kajiwara, Ken; Hamamatsu, Kiyotaka; et al.
Fusion Engineering and Design, 53(1-4), p.129 - 135, 2001/01
Times Cited Count:12 Percentile:64.73(Nuclear Science & Technology)no abstracts in English
Saito, Yuji; Kimura, Hiroaki*; Suzuki, Yoshio*; Nakatani, Takeshi*; Matsushita, Tomohiro*; Muro, Takayuki*; Miyahara, Tsuneaki*; Fujisawa, M.*; Soda, Kazuo*; Ueda, Shigenori*; et al.
Review of Scientific Instruments, 71(9), p.3254 - 3259, 2000/09
Times Cited Count:187 Percentile:98.99(Instruments & Instrumentation)no abstracts in English
Koike, Masato; Namioka, Takeshi*; Gullikson, E. M.*; Harada, Yoshihisa*; Ishikawa, Sadayuki*; Imazono, Takashi*; Mrowka, S.*; Miyata, Noboru; Yanagihara, Mihiro*; Underwood, J. H.*; et al.
Soft X-Ray and EUV Imaging Systems (Proceedings of SPIE Vol.4146), p.163 - 170, 2000/00
no abstracts in English
Yamazaki, Takashi; Gullikson, E. M.*; Miyata, Noboru*; Koike, Masato; Harada, Yoshihisa*; Mrowka, S.*; Kleineberg, U.*; Underwood, J. H.*; Yanagihara, Mihiro*; Sano, Kazuo*
Applied Optics, 38(19), p.4001 - 4003, 1999/07
Times Cited Count:22 Percentile:69.86(Optics)no abstracts in English
Koike, Masato
X-sen Ketsuzo Kogaku Nyuzu Reta, (9), p.1 - 2, 1999/02
no abstracts in English
Koike, Masato; *; Harada, Yoshihisa*
Journal of Electron Spectroscopy and Related Phenomena, 101-103, p.913 - 918, 1999/00
Times Cited Count:20 Percentile:66.63(Spectroscopy)no abstracts in English